Highly reliable oscillating mirror system for synchrotron radiation lithography
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Published:1991-11
Issue:6
Volume:9
Page:3218
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ISSN:0734-211X
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Container-title:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
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language:
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Short-container-title:J. Vac. Sci. Technol. B
Publisher
American Vacuum Society
Subject
General Engineering
Cited by
3 articles.
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1. Applicability test for synchrotron radiation x-ray lithography in 64-Mb dynamic random access memory fabrication processes;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1994-11
2. Applications of faceted mirrors to X-ray lithography beamlines;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1994-08
3. Sub-half-micron metal–oxide–semiconductor device fabrication using a compact synchrotron radiation lithography system;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1993-11