Determining depth profiles from angle dependent x‐ray photoelectron spectroscopy: The effects of analyzer lens aperture size and geometry-Reference-Cited by-同舟云学术

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Determining depth profiles from angle dependent x‐ray photoelectron spectroscopy: The effects of analyzer lens aperture size and geometry

Published:1989-05 Issue:3 Volume:7 Page:1646-1654
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Tyler Bonnie J.,Castner David G.,Ratner Buddy D.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.576065

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