Field emission induced fabrication of nanostructures on Au thin films using a noncontact mode atomic force microscope-Reference-Cited by-同舟云学术

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Field emission induced fabrication of nanostructures on Au thin films using a noncontact mode atomic force microscope

Published:2003 Issue:4 Volume:21 Page:1357
ISSN:0734-211X
Container-title:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
language:en
Short-container-title:J. Vac. Sci. Technol. B

Author:

Park Kang-Ho,Kim Jeongyong,Ha Jeong Sook,Song Ki-Bong

Publisher

American Vacuum Society

Subject

General Engineering

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Sharp GaN nanowires used as field emitter on active cantilevers for scanning probe lithography;Journal of Vacuum Science & Technology B;2018-11

2. Experimental study of field emission from ultrasharp silicon, diamond, GaN, and tungsten tips in close proximity to the counter electrode;Journal of Vacuum Science & Technology B;2018-11

3. Structural and electrical characterization of platinum (~15at%) doped nickel silicides on Si(100) and SiGe/Si(100) substrates;Materials Science in Semiconductor Processing;2016-03

4. Nanodot deposition and its application with atomic force microscope;Journal of Nanoparticle Research;2013-05-08

5. Atomic Force Microscope Deposition Assisted by Electric Field;Advanced Materials Research;2013-03

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