Examination of thin films in the ZrO2–SiO2 system by transmission electron microscopy and x‐ray diffraction techniques-Reference-Cited by-同舟云学术

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Examination of thin films in the ZrO2–SiO2 system by transmission electron microscopy and x‐ray diffraction techniques

Published:1987-07 Issue:4 Volume:5 Page:1671-1674
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Farabaugh E. N.,Feldman A.,Sun J.,Sun Y. N.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.574544

Cited by 28 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Chemical regulation in the bonding reconstruction stage of amorphous Zr-Si oxidation and the resultant phase selection;Materials & Design;2023-09

2. Forming protective nanoscale coatings based on Al_2O_3 (Al_2O_3–AlF_3) on a glass surface;Journal of Optical Technology;2011-02-01

3. RETRACTED ARTICLE: Refractive-index tailoring and morphological evolutions in Gd2O3–SiO2 and ZrO2–SiO2 composite thin films;Applied Physics A;2007-06-26

4. RETRACTED: Analysis of codeposited Gd2O3/SiO2 composite thin films by phase modulated spectroscopic ellipsometric technique;Applied Surface Science;2006-12

5. A Study of CVD Growth Kinetics and Film Microstructure of Zirconium Dioxide from Zirconium Tetra-tert-Butoxide;Chemistry of Materials;2002-01-29

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