Analysis of high-index Si(001) surfaces by reflectance difference spectroscopy-Reference-Cited by-同舟云学术

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Analysis of high-index Si(001) surfaces by reflectance difference spectroscopy

Published:1999-07 Issue:4 Volume:17 Page:1652-1656
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Mantese L.,Xue Q. K.,Sakurai T.,Aspnes D. E.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.581867

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. SiO2/Si interfaces on high-index surfaces: Re-evaluation of trap densities and characterization of bonding structures;Applied Physics Letters;2011-02-28

2. Vacuum-ultraviolet reflectance difference spectroscopy for characterizing dielectrics–semiconductor interfaces;Thin Solid Films;2011-02

3. Reflectance Difference Spectroscopy in Vacuum–Ultraviolet Range: Developing Measurement System and Applying to Characterization of SiO2/Si Interfaces;Japanese Journal of Applied Physics;2010-02-22

4. Optical and Electronic Anisotropy of a π-Conjugated Molecular Monolayer on the Silicon(001) Surface;The Journal of Physical Chemistry B;2003-07-16

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