Microcorrosion of Al–Cu and Al–Cu–Si alloys: Interaction of the metallization with subsequent aqueous photolithographic processing
Author:
Publisher
American Vacuum Society
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Link
http://avs.scitation.org/doi/pdf/10.1116/1.576800
Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Transmission electron microscopy characterization of Al2Cu precipitate growth kinetics by in situ heat treatment;Vacuum;2008-09
2. Morphology evolution in TiN/Al–0.5Cu/Ti interconnection during chamber long stay and post-deposition annealing correlated to defect formation in metallization processing;Microelectronic Engineering;2008-07
3. Effect of Si addition on the precipitation of Al2Cu-phase in Al-Cu-Si thin films;Journal of Materials Science;2005-08
4. Al-Cu-Si (Aluminium - Copper - Silicon);Light Metal Systems. Part 2;2005
5. Precipitation of Al2Cu in blanket Al-Cu films;Journal of Applied Physics;1997-10-15
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