Author:
Vender David,Oehrlein Gottlieb S.,Schwartz Geraldine C.
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Cited by
2 articles.
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1. Interlevel Dielectrics;Handbook of Semiconductor Interconnection Technology, Second Edition;2006-02-22
2. Infrared spectroscopic techniques for quantitative characterization of dielectric thin films on silicon wafers;Spectrochimica Acta Part A: Molecular Spectroscopy;1994-09