Author:
Crosby Robert,Jones K. S.,Law M. E.,Larsen A. Nylandsted,Hansen J. Lundsgaard
Cited by
2 articles.
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1. Role of the Ge surface during the end of range dissolution;Applied Physics Letters;2012-10-15
2. Defects in Ge and Si caused by 1 MeV Si[sup +] implantation;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;2008