Analysis of thin-film structures with nuclear backscattering and x-ray diffraction
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Published:1974-01
Issue:1
Volume:11
Page:86-93
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ISSN:0022-5355
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Container-title:Journal of Vacuum Science and Technology
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language:en
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Short-container-title:Journal of Vacuum Science and Technology
Author:
Mayer J. W.,Tu K. N.
Publisher
American Vacuum Society
Subject
General Engineering
Cited by
109 articles.
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