Processing of experimental current-voltage characteristics of single tip emitters taking into account the functional dependence of the emission area on the applied voltage

Author:

Popov Eugeni O.1ORCID,Filippov Sergey V.1ORCID,Kolosko Anatoly G.1ORCID

Affiliation:

1. Ioffe Institute, 26 Politekhnicheskaya, St. Petersburg 194021, Russian Federation

Abstract

The work addresses the question of the field-dependence of the notional emission area for a field-emitter tip using computer simulation and experimental data. Based on finite-element method calculations, it was determined that for single field emitters having a given shape, there is a stable and characteristic shift of the degree of voltage in the pre-exponential voltage exponent of the field emission equation relative to the “planar” case. A power-law fit to the 3D-data was applied so as to use it in the analysis of the current-voltage data using a k-power plot (KP-plot) of semilogarithmic type. A comparison of effective emission parameters obtained from the model current-voltage characteristic with the classical Fowler–Nordheim plot, modern Murphy–Good plot, and new KP-plot is carried out. The KP-plot is subsequently used to analyze the experimental data of Tungsten emitters having a scanning emission microscope determined apex radius. The new semilogarithmic analysis reveals that the apex radius of curvature is within the observed range.

Publisher

American Vacuum Society

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials

Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A unified thermal-field emission theory for metallic nanotips;Journal of Applied Physics;2023-12-04

2. Advantages of K-Power Plot for Experimental IVC Processing;2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC);2023-07-10

3. Fast and accurate determination of the curvature-corrected field emission current;Journal of Applied Physics;2023-03-07

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3