Author:
Dearnaley G.,Hartley N. E. W.,Turner J. F.,Garnsey R.,Woolsey I. S.
Cited by
12 articles.
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1. Ion beam analysis of Li diffused Ge–Li interfaces;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1992-07
2. Application of charged-particle beams in science and technology;La Rivista del Nuovo Cimento;1992-03
3. Depth profiling of lithium by use of the nuclear reaction 7Li(p, α)4He;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1988-10
4. A review of the stainless steel surface;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1983-01
5. Light element profiling using nuclear reaction analysis on tapered corrosion sections;Journal of Radioanalytical Chemistry;1979-03