Application of charged-particle beams in science and technology-Reference-Cited by-同舟云学术

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Application of charged-particle beams in science and technology

Published:1992-03 Issue:3 Volume:15 Page:1-73
ISSN:1826-9850
Container-title:La Rivista del Nuovo Cimento
language:en
Short-container-title:Riv. Nuovo Cim.

Author:

Valkovic V.,Moschini G.

Publisher

Springer Science and Business Media LLC

Subject

General Physics and Astronomy

Link

http://link.springer.com/content/pdf/10.1007/BF02790869.pdf

Reference189 articles.

1. J. L. Duggan andI. L. Morgan (Editors):Application of accelerators in research and industry ’86, inNucl. Instrum. Methods Phys. Res. B,24–25 (1987).

2. H. van Rinsvelt, S. Bauman, J. W. Nelson andJ. W. Winchester (Editors):Particle-induced X-rayemission and its analytical applications, inNucl. Instrum. Methods Phys. Res. B,22, No. 1–3 (1987).

3. J. L. Duggan andI. L. Morgan (Editors):Application of accelerators in research and industry ’88, inNucl. Instrum. Methods Phys. Res. B,40–41 (1989).

4. M. L. Mallory:Proceedings of the XI International Conference on Cyclotrons and their Applications, (Ionics, Tokyo, 1987), p. 558.

5. M. A. Nicolet, J. W. Mayer andI. V. Mitchel:Science,177, 184 (1972).

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