Piezoelectric oscillation sensor based noncontact atomic force microscope for imaging in both ambient and liquid environments-Reference-Cited by-同舟云学术

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Piezoelectric oscillation sensor based noncontact atomic force microscope for imaging in both ambient and liquid environments

Published:2015-03 Issue:2 Volume:33 Page:021801
ISSN:2166-2746
Container-title:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
language:en
Short-container-title:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena

Author:

Froning Jens P.,Xia Dan,Zhang Shuai,Lægsgaard Erik,Besenbacher Flemming,Dong Mingdong

Publisher

American Vacuum Society

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials

Link

http://avs.scitation.org/doi/pdf/10.1116/1.4906517

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Metal–Electrolyte Interfaces;Surface and Interface Science;2020-01-10

2. Optomechanical resonating probe for very high frequency sensing of atomic forces;Nanoscale;2020

3. Force spectroscopy using a quartz length-extension resonator;Applied Physics Letters;2019-10-21

4. Scanning Probe Microscopy;Handbook of Solid State Chemistry;2017-08-09

5. Contributed Review: Quartz force sensing probes for micro-applications;Review of Scientific Instruments;2016-07

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