Force spectroscopy using a quartz length-extension resonator
Author:
Affiliation:
1. Department of Advanced Materials Science, The University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8561, Japan
2. Department of Physics, University of Alberta, Edmonton, Alberta T6G 2J1, Canada
Funder
Japan Society for the Promotion of Science
Toray Science Foundation
Asahi Glass Foundation
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5112062
Reference33 articles.
1. Advances in atomic force microscopy
2. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity
3. Quantitative Measurement of Short-Range Chemical Bonding Forces
4. Chemical identification of individual surface atoms by atomic force microscopy
5. Electronegativity determination of individual surface atoms by atomic force microscopy
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