Performance of a scanning force microscope using a laser diode-Reference-Cited by-同舟云学术

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Performance of a scanning force microscope using a laser diode

Published:1990-01 Issue:1 Volume:8 Page:378-382
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Sarid Dror,Iams Douglas A.,Ingle Jeffery T.,Weissenberger Volker,Ploetz Josef

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.576400

Cited by 22 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Resonant Cavity Thin Film Photodiode for Compact Displacement Sensor;Japanese Journal of Applied Physics;2004-04-27

3. Measurement of changes in optical path length and reflectivity with phase-shifting laser feedback interferometry;Applied Optics;1999-04-01

4. AFM Instrumentation and Tips;Handbook of Micro/Nano Tribology, Second Edition;1998-12-17

5. Magnetic force microscopy of thin film media for high density magnetic recording;Journal of Magnetism and Magnetic Materials;1998-02

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