Angle‐resolved self‐ratio measurements on ion‐implanted depth profiles by synchrotron x‐ray fluorescence spectrometry-Reference-Cited by-同舟云学术

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Angle‐resolved self‐ratio measurements on ion‐implanted depth profiles by synchrotron x‐ray fluorescence spectrometry

Published:1994-07 Issue:4 Volume:12 Page:2467-2472
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Schmitt W.,Rothe J.,Hormes J.,Gries W. H.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.579195

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Depth profile and microscopic structure of gold-implanted aluminum using X-ray spectroscopies;Fresenius' Journal of Analytical Chemistry;1999-09-08

2. Ion-implanted Surface Analysis Reference Materials: Certification of Dose Densities from 1016 to 1013 cm-2;Surface and Interface Analysis;1996-07

3. A general procedure for extracting quantitative depth information from take-off-angle-resolved XPS and AES;Applied Surface Science;1996-07

4. Thickness determination of thin solid films by angle-resolved X-ray fluorescence spectrometry using monochromatized synchrotron radiation;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1995-05

5. Atomic Spectrometry Update—Atomic Emission Spectrometry;J. Anal. At. Spectrom.;1995

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