Relative elemental sensitivity factors in secondary neutral mass spectrometry-Reference-Cited by-同舟云学术

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Relative elemental sensitivity factors in secondary neutral mass spectrometry

Published:1988-07 Issue:4 Volume:6 Page:2265-2270
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Wucher A.,Novak F.,Reuter W.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.575022

Cited by 48 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analyzing of lead, tin and germanium tellurides by means of secondary neutral mass spectrometry: Features, problems and possibilities;Materials Today: Proceedings;2021

2. Determination of diffusion coefficients in immiscible systems: Cu W as an example;Materialia;2019-06

3. Relative detection factor for quantification of Secondary Neutral Mass Spectrometry measurements of PbTe binary telluride;Vacuum;2019-05

4. Peculiar properties of preferential sputtering of PbTe, SnTe, and GeTe by Ar+ ion plasma;Materials Science in Semiconductor Processing;2018-12

5. Anion formation by neutral resonant ionization;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-10

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