Interface depth resolution of Auger sputter profiled Ni/Cr interfaces: Dependence on ion bombardment parameters-Reference-Cited by-同舟云学术

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Interface depth resolution of Auger sputter profiled Ni/Cr interfaces: Dependence on ion bombardment parameters

Published:1985-05 Issue:3 Volume:3 Page:1413-1417
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Fine Joseph,Lindfors P. A.,Gorman M. E.,Gerlach R. L.,Navinšek B.,Mitchell D. F.,Chambers G. P.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.572791

Cited by 63 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Determination of the composition of Ultra-thin Ni-Si films on Si: constrained modeling of electron probe microanalysis and x-ray reflectivity data;X-Ray Spectrometry;2008-11

3. Evaluation of the shapes of Auger- and secondary-electron line scans across interfaces with the logistic function;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2006-07

4. Challenges in the Surface Analytical Characterisation of Anodic TiO2Films – a Review;Zeitschrift für Physikalische Chemie;2005-11

5. Sputter-depth profiling for thin-film analysis;Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences;2003-11-25

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