Deposition of Mo/Si multilayers onto MEMS micromirrors and its utilization for extreme ultraviolet maskless lithography

Author:

Chkhalo Nikolay1,Polkovnikov Vladimir1,Salashchenko Nikolay1,Toropov Mikhail1

Affiliation:

1. Institute for Physics of Microstructures of RAS, GSP-105, Nizhny Novgorod 603950, Russia

Funder

Russian Foundation for Basic Research (RFBR)

Russian Science Foundation (RSF)

Publisher

American Vacuum Society

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials

Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Past progress, current status, and future perspective of digital EUV lithography for high-resolution semiconductor manufacturing;Novel Patterning Technologies 2024;2024-04-09

2. Study of the X-ray Optical and Mechanical Characteristics of C/Si and B4C/Si Multilayer Mirrors;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2023-12

3. Stress-Free Highly Reflective Multilayer Mo/Be/Si Mirrors for Operation in the Vicinity of the Wavelength 13.5 nm;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2023-12

4. Study of the X-Ray Optical and Mechanical Characteristics of C/Si and B<sub>4</sub>C/Si Multilayer Mirrors;Поверхность. Рентгеновские, синхротронные и нейтронные исследования;2023-12-01

5. Highly reflective Mo/Be/Si multilayer mirrors with zero stress values for 13.5 nm wavelength;Thin Solid Films;2023-10

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