The design, performance, and application of an atomic force microscope‐based profilometer-Reference-Cited by-同舟云学术

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The design, performance, and application of an atomic force microscope‐based profilometer

Published:1995-05 Issue:3 Volume:13 Page:983-989
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

McEachern R. L.,Moore C. E.,Wallace R. J.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.579662

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