Evaluation of correction parameters for elastic-scattering effects in x-ray photoelectron spectroscopy and Auger electron spectroscopy-Reference-Cited by-同舟云学术

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Evaluation of correction parameters for elastic-scattering effects in x-ray photoelectron spectroscopy and Auger electron spectroscopy

Published:1997-07 Issue:4 Volume:15 Page:2095-2106
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Jablonski A.,Powell C. J.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.580615

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3. Effective Attenuation Lengths for Different Quantitative Applications of X-ray Photoelectron Spectroscopy;Journal of Physical and Chemical Reference Data;2020-09-01

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5. Effective attenuation lengths for photoelectrons emitted by high-energy laboratory X-ray sources;Journal of Electron Spectroscopy and Related Phenomena;2015-02

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