Summary Abstract: A scanning tunneling microscope combined with a scanning field emission microscope-Reference-Cited by-同舟云学术

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Summary Abstract: A scanning tunneling microscope combined with a scanning field emission microscope

Published:1988-03 Issue:2 Volume:6 Page:379-379
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Emch R.,Niedermann Ph.,Descouts P.,Fischer O/.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.575420

Cited by 20 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analysis of the surface termination ofNd1+xBa2−xCu3Oythin films;Physical Review B;2004-09-28

2. Why are sputter deposited Nd1+xBa2−xCu3O7−δ thin films flatter than NdBa2Cu3O7−δ films?;Applied Physics Letters;2001-11-26

3. Growth of R1+xBa2-xCu3O7-? Epitaxial Films Investigated by In Situ Scanning Tunneling Microscopy;physica status solidi (a);2001-08

4. Ballistic-electron-emission-microscopy studies onAu/SiO2/n-type Si(100) andIr/SiO2/n-type Si(100) structures with very thin oxides;Physical Review B;1998-03-15

5. Design considerations and performance of a combined scanning tunneling and scanning electron microscope;Review of Scientific Instruments;1997-10

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