1. Mayberry M, Johnson J, Shahriari N, et al. Realizing the benefits of structural test for Intel microprocessors [A]. International Test Conference[C]. 2002, 456–463.
2. Golshan F. Test and on-line debug capabilities of IEEE Std 1149.1 in UltraSPARC™-III microprocessor[A]. International Test Conference, Proceedings[C]. 2000, 141–150.
3. Bhavsar D, Tan R. Observability register architecture for efficient production test and debug of VLSI circuits [A]. Fourteenth International Conference on VLSI Design [C]. 2001, 385–390.
4. Corno F, Cumani G, Sonza Reorda M, et al. Fully automatic test program generation for microprocessor cores [A]. Design, Automation and Test in Europe Conference and Exhibition[C]. 2003, 1006–1011.
5. Hwang S, Abraham J A. Test data compression and test time reduction using an embedded microprocessor [J]. IEEE Trans. on Very Large Scale Integration (VLSI) Systems, 2003, 11(5): 853–862.