Author:
Sungbae Hwang ,Abraham J.A.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
8 articles.
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1. Reusing existing resources for testing a multi-processor system-on-chip;International Journal of Electronics;2013-03
2. Test data compression based on geometric shapes;Computers & Electrical Engineering;2011-05
3. An Efficient SoC Test Technique by Reusing On/Off-Chip Bus Bridge;IEEE Transactions on Circuits and Systems I: Regular Papers;2009-03
4. Low-Cost Scan Test for IEEE-1500-Based SoC;IEEE Transactions on Instrumentation and Measurement;2008-05
5. Multilevel Huffman Coding: An Efficient Test-Data Compression Method for IP Cores;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2007-06