1. Aabid, M.A.E., Guilley, S., Hoogvorst, P.: Template attacks with a power model. Cryptology. ePrint Archive, Report 2007/443 (2007). http://eprint.iacr.org/2007/443/
2. Agilent Technologies: Agilent InfiniiVision 5000/6000/7000 Series Oscilloscopes—User’s Guide. http://cp.literature.agilent.com/litweb/pdf/54695-97022.pdf
3. Agrawal, D., Rao, J.R., Rohatgi, P., Schramm, K.: Templates as master keys. In: CHES, vol. 3659, pp. 15–29. Springer. Edinburgh (2005)
4. Archambeau, C., Peeters, É., Standaert, F.X., Quisquater, J.J.: Template attacks in principal subspaces. In: CHES, LNCS, vol. 4249, pp. 1–14. Springer. Yokohama (2006)
5. Baba, A.H., Mitra, S.: Testing for transistor aging. In: VTS, pp. 215–220 (2009)