Degradation Analysis with Measurement Errors
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Publisher
Springer Singapore
Link
http://link.springer.com/content/pdf/10.1007/978-981-10-8168-2_8
Reference42 articles.
1. Bagdonavičius, V., & Nikulin, M. S. (2000). Estimation in degradation models with explanatory variables. Lifetime Data Analysis, 7, 85–103.
2. Barndorff-Nielsen, O. E., Mikosch, T., & Resnick, S. I. (2001). Lévy Processes: Theory and Applications. Boston: Birkhäuse.
3. Cheng, Y. S., & Peng, C. Y. (2012). Integrated degradation models in R using iDEMO. Journal of Statistical Software, 49, 1–22.
4. Chuang, S. L., Ishibashi, A., Kijima, S., Nakayama, N., Ukita, M., & Taniguchi, S. (1997). Kinetic model for degradation of light-emitting diodes. IEEE Journal of Quantum Electronics, 33, 970–979.
5. Di Nardo, E., Nobile, A. G., Pirozzi, E., & Ricciardi, L. M. (2001). A computational approach to first-passage-time problems for Gauss-Markov processes. Advances in Applied Probability, 33, 453–482.
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