Author:
Kumar Shashi,Iwahori Yuji,Bhuyan M. K.
Reference10 articles.
1. Inoue, H., Iwahori, Y., Kijsirikul, B., Bhuyan, M. K.: SVM Based Defect Classification of Electronic Board Using Bag of Keypoints. ITC-CSCC 2015, 31–34 (2015)
2. Ibrahim, Z., Al-Attas, S. A, R., Aspar, Z.: Model-based PCB Inspection Technique Using Wavelet Transform. 4th Asian Control Conference, September 25–27 (2002)
3. Heriansyah, R., Al-Attas, S. A. R., Zabidi, M. M.: Neural Network Paradigm for Classification of Defects on PCB. Master Thesis, University Teknologi Malaysia (2004)
4. West, G. A. W., Norton-Wayne, L., Hill, W. J.: The Automatic Visual Inspection of Printed Circuit Boards. Circuit World, Vol. 8, No. 2, 50–56 (1982)
5. West, G. A. W.: A System for the Automatic Visual Inspection of BarePrinted Circuit Boards. IEEE Transactions of Systems, Man and Cybernetics, Vol. SMC-14, No. 5, 767–773, September/October (1984)
Cited by
6 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献