Fault Classification Based Approximate Testing of Digital VLSI Circuit
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Publisher
Springer Singapore
Link
http://link.springer.com/content/pdf/10.1007/978-981-15-7031-5_61
Reference18 articles.
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4. Ye B, Zhao Q, Zhou D, Wang X, Luo M (2011) Test data compression using alternating variable run-length code. Integr VLSI J 44(2):103–110
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1. On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd Optimization;Journal of Electronic Testing;2021-11-19
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