TCAS System Fault Research and Troubleshooting Process
Author:
Publisher
Springer Nature Singapore
Link
https://link.springer.com/content/pdf/10.1007/978-981-16-9735-7_58
Reference7 articles.
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3. Fu, W., Chien, C.F.: UNISON data-driven intermittent demand forecast framework to empower supply chain resilience and an empirical study in electronics distribution. Comput. Ind. Eng. 135, 940–949 (2019)
4. Jang, J., Min, B.W., Kim, C.O.: Denoised residual trace analysis for monitoring semiconductor process faults. IEEE Trans. Semicond. Manuf. 32(3), 293–301 (2019)
5. Kang, S.: Joint modeling of classification and regression for improving faulty wafer detection in semiconductor manufacturing. J. Intell. Manuf. 31(2), 319–326 (2020)
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