Improvement of Electrical Characteristics for Nanoscale Single-Gate FDSOI Using Gate Oxide Engineering
Author:
Publisher
Springer Nature Singapore
Link
https://link.springer.com/content/pdf/10.1007/978-981-19-0312-0_72
Reference17 articles.
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4. Kim BY (2010) Challenges for nanoscale MOSFETs and emerging Nanoelectronics. Trans Electr Electron Mater 11:93–105. https://doi.org/10.4313/TEEM.2010.11.3.093
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