1. IEEE Std. 1149.1 1990. Standard Test Access Port and Boundary-Scan Architecture. IEEE Standards Board, Outubro (1993)
2. IEEE Std. 1149.4. 1999. Standard for a Mixed-Signal Test Bus. IEEE Standards Board, Junho (1999)
3. Felgueiras, M., Alves, G., Ferreira, J.: An embedded 1149.4 extension to support mixed-signal debugging. Microelectron. J. 42(1), 218–232. An embedded 1149.4 extension to support mixed-signal debugging – ScienceDirect (2011)
4. Felgueiras, M.C., Alves, G.C., Ferreira, J.M.M.: Measurements in 1149.4 environments – correcting the infrastructure switches influence. In: Proceedings of the IEEE Board Test Workshop, 2007, IEEE 6th International Board Test Workshop (BTW’07), Fort Collins (Colorado), EUA, 12–14 setembro 2007. 091.C-BTW_2007.pdf - Google Drive (2007)
5. Felgueiras, M.C., Alves, G.C., Ferreira, J.M.M.: Integrity checking of 1149.4 extensions to 1149.1. In: Proceedings of the XXI Conference on Design of Circuits and Integrated Systems (DCIS´06), p. 23. Barcelona, Espanha, 22–24 novembro 2006. 086.C-IMSTW_2007.pdf - Google Drive (2006)