Research on the Experimental System and Method for Radiation Effects of Nanoscale Electronics in Orbit Space

Author:

Wang Hongxia,Liu Hongjin,Peng Fei,Zhang Shaolin,Li Bin,Yu Weiwei,Ma Yuanhang,Liu Yinghui,Deng Zheng

Publisher

Springer Nature Singapore

Reference11 articles.

1. Wang, H.: Method, device and system for radiation resistance testing of components: ZL202010487581.1. 2020-09-22 (2020)

2. Wang, Q.Q., Liu, H.X., Wang, S.L., et al.: TCAD simulation of single-event-transient effects in L-shaped channel tunneling field-effect transistors. IEEE Trans. Nuclear Sci. 65(8), 2250–2259 (2018)

3. Rezzak, N., Maillard, P., Schrimpf, R.D., et al.: The impact of device width on the variability of post-irradiation leakage currents in 90 and 65 nm CMOS technologies. Microelectronics Reliability 52(11), 2521–2526 (2012)

4. Qingkui, Y., Wang, H., Cao, S., et al.: Test method for ground equivalent evaluation of single event effects caused by direct and indirect ionization of space protons. Spacecraft Environ. Eng. 38(3), 351–353 (2021)

5. Li, T.: Radiation effects and radiation hardening techniques for deep submicron and nanoscale integrated circuits. Xidian University, Shaanxi (2018)

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3