Author:
Yuan Shuai,Chu Tianshu,Hou Jing
Reference14 articles.
1. Buckwell, M., Zarudnyi, K., Montesi, L., et al.: Conductive AFM topography of intrinsic conductivity variations in silica based dielectrics for memory applications. ECS Trans. 75(5), 3–9 (2016)
2. Zhang, D., Wang, X., Song, W., et al.: Analysis of crystallization property of LDPE/Fe3O4 nano-dielectrics based on AFM measurements. J. Mater. Sci. Mater. Electron. 28(4), 3495–3499 (2017)
3. Boneschanscher, M., Van Der Lit, J., Sun, Z.X., et al.: Quantitative atomic resolution force imaging on epitaxial graphene with reactive and nonreactive AFM probes. ACS Nano 6(11), 10216–10221 (2012)
4. Hou, J., Wu, C.D., Liu, L.Q., et al.: Research on the kinematics model of nanoparticles based on AFM. Chin. J. Sci. Instrum. 32(8), 1851–1857 (2011) (in Chinese)
5. Korayem, M.H., Homayooni, A., Hefzabad, R.N.: Non-classic multiscale modeling of manipulation based on AFM, in aqueous and humid ambient. Surf. Sci. 671(671), 27–35 (2018)
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献