Quantitative Atomic Resolution Force Imaging on Epitaxial Graphene with Reactive and Nonreactive AFM Probes-Reference-Cited by-同舟云学术

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Quantitative Atomic Resolution Force Imaging on Epitaxial Graphene with Reactive and Nonreactive AFM Probes

Published:2012-10-12 Issue:11 Volume:6 Page:10216-10221
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Boneschanscher Mark P.¹,van der Lit Joost¹,Sun Zhixiang¹²,Swart Ingmar¹,Liljeroth Peter³,Vanmaekelbergh Daniël¹

Affiliation:

1. Condensed Matter and Interfaces, Debye Institute for Nanomaterials Science, Utrecht University, P.O. Box 80000, 3508 TA Utrecht, The Netherlands

2. Max Planck Institute for Solid State Research, Heisenbergstrasse 1, 70569 Stuttgart, Germany

3. Department of Applied Physics, Aalto University School of Science, P.O. Box 15100, 00076 Aalto, Finland

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/nn3040155

Reference35 articles.

1. The rise of graphene

2. The electronic properties of graphene

3. Atom-by-atom spectroscopy at graphene edge

4. Strain-Induced Pseudo–Magnetic Fields Greater Than 300 Tesla in Graphene Nanobubbles

5. Quantum-Confined Electronic States in Atomically Well-Defined Graphene Nanostructures

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