Comparative Analysis of Various SRAM Bit Cells for 32 nm Technology Node

Author:

Srivastava Prakhar,Rawat BhawnaORCID,Mittal PoornimaORCID

Publisher

Springer Nature Singapore

Reference35 articles.

1. Rawat, B., Mittal, P.: A reliable and temperature variation tolerant 7T SRAM cell with single bitline configuration for low voltage application. Circuits Syst. Signal Process. 41, 2779–2801 (2022)

2. Abu-Rahma, M.H., Anis, M.: Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield, 1st edn. Springer, New York, NY (2013)

3. Rawat, B., Mittal, P.: Single bit line accessed high performance ultra low voltage operation 7T SRAM cell with improved read stability. Int. J. Circuit Theory Appl. 49(5), 1435–1449 (2021)

4. Mittal, P., Kumar, N.: Comparative analysis of 90nm MOSFET and 18nm FinFET based different Multiplexers for low power digital circuits. International Journal of Advanced Science and Technology 29, 4089–4096 (2020)

5. Surana, N., Mekie, J.: Energy efficient single-ended 6-T SRAM for multimedia applications. IEEE Trans. Circuits Syst. II Express Briefs 66(6), 1023–1027 (2019)

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