Effect of AFM Scan Size on the Scaling Law of Sputtered Aluminium Thin Films
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Publisher
Springer Singapore
Link
https://link.springer.com/content/pdf/10.1007/978-981-15-5753-8_16
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1. Fractal Theory in Thin Films: Literature Review and Bibliometric Evidence on Applications and Trends;Fractal and Fractional;2022-08-31
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