Surface Roughness Measurements Using Power Spectrum Density Analysis with Enhanced Spatial Correlation Length
Author:
Affiliation:
1. Kazuo Inamori School of Engineering, Alfred University, Alfred, New York 14802, United States
2. Department of Chemical Engineering and Materials Science, Michigan State University, East Lansing, Michigan 48824, United States
Funder
Nuclear Energy University Programs
Publisher
American Chemical Society (ACS)
Subject
Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials
Link
https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.6b06635
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3. Influence of substrate roughness on the bonding mechanisms of high velocity oxy-fuel sprayed coatings
4. Fractal analyses of ITO thin films: A study based on power spectral density
5. Effect of indium tin oxide substrate roughness on the morphology, structural and optical properties of CdS thin films
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