Studies of CdTe surfaces with secondary ion mass spectrometry, rutherford backscattering and ellipsometry
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Materials Science,General Chemistry,General Engineering
Link
http://link.springer.com/content/pdf/10.1007/BF00900533.pdf
Reference19 articles.
1. P.Siffert, R.Berger, C.Scharager, A.Cornet, R.Stuck: IEEE Trans. NS-23, 1959 (1976)
2. H.L.Malm, M.Martini: Can. J. Phys.51, 2336 (1973)
3. R.O.Bell, G.Entine, H.B.Serreze: Nucl. Instr. Meth.117, 267 (1974)
4. P.Siffert, M.Hage Ali, R.Stuck, A.Cornet: Rev. Phys. Appl.2, 335 (1977)
5. R.O.Bell, N.Hemmat, F.V.Wald: Phys. Stat. Sol. A1, 375 (1970)
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