Growth and in situ high-pressure reflection high energy electron diffraction monitoring of oxide thin films
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Physics and Astronomy
Link
http://link.springer.com/content/pdf/10.1007/s11433-013-5352-6.pdf
Reference74 articles.
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4. Rijnders G, Koster G, Blank D H A, et al. In situ monitoring during pulsed laser deposition of complex oxides using reflection high energy electron diffraction under high oxygen pressure. Appl Phys Lett, 1997, 70: 1888–1890
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