Ag/BST/p-Si MFS Device Production and Characterization

Author:

Jasim Bassam Mohammed,Kaleli MuratORCID

Publisher

Springer Science and Business Media LLC

Subject

Multidisciplinary

Reference38 articles.

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2. Kaynak, C.B.: Characterization of Perovskite-like High k Dielectric Materials for Metal-Insulator-Metal Capacitors. Springer, Berlin (2013)

3. Tao, J., et al.: Extrinsic and intrinsic frequency dispersion of high-k materials in capacitance-voltage measurements. Materials 5(12), 1005–1032 (2012). https://doi.org/10.3390/ma5061005

4. B. Mohammed: The influence of electrodes on Mim BST thin film ceramic capacitor – device production and charachterization. Süleyman Demirel University, 2019

5. RoHS, “RoHS,” rohsguide, 2019. https://www.rohsguide.com/rohs-reach.htm (accessed Aug. 05, 2019)

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