Fast digital electronics for application in dynamic force microscopy using high-Q cantilevers-Reference-Cited by-同舟云学术

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Fast digital electronics for application in dynamic force microscopy using high-Q cantilevers

Published:1998-03-01 Issue:7 Volume:66 Page:S215-S218
ISSN:0947-8396
Container-title:Applied Physics A: Materials Science & Processing
language:
Short-container-title:Applied Physics A: Materials Science & Processing

Author:

Loppacher C.,Bammerlin M.,Battiston F.,Guggisberg M.,Müller D.,Hidber H.R.,Lüthi R.,Meyer E.,Güntherodt H.J.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1007/s003390051132.pdf

Cited by 70 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Steady-state and transient behavior in dynamic atomic force microscopy;Journal of Applied Physics;2019-01-28

2. Quantifying Tip-Sample Interactions in Vacuum Using Cantilever-Based Sensors: An Analysis;Physical Review Applied;2018-04-26

3. Exploring site-specific chemical interactions at surfaces: a case study on highly ordered pyrolytic graphite;Nanotechnology;2016-11-04

4. Robust high-resolution imaging and quantitative force measurement with tuned-oscillator atomic force microscopy;Nanotechnology;2016-01-12

5. Tracking speed bumps in organic field-effect transistors via pump-probe Kelvin-probe force microscopy;Journal of Applied Physics;2015-12-28

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