Steady-state and transient behavior in dynamic atomic force microscopy
Author:
Affiliation:
1. Nanotechnology Group, ETH Zürich, Säumerstrasse 4, 8803 Rüschlikon, Switzerland
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5078954
Reference63 articles.
1. Atomic Force Microscope
2. Dynamic atomic force microscopy methods
3. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale
4. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity
5. Energy dissipation in tapping-mode atomic force microscopy
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