Strain relaxation at cleaved surfaces studied by atomic force microscopy-Reference-Cited by-同舟云学术

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Strain relaxation at cleaved surfaces studied by atomic force microscopy

Published:1999-09-01 Issue:3 Volume:69 Page:347-351
ISSN:0947-8396
Container-title:Applied Physics A: Materials Science & Processing
language:
Short-container-title:Applied Physics A: Materials Science & Processing

Author:

Lelarge F.,Dehaese O.,Kapon E.,Priester C.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1007/s003390051012.pdf

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Influence of surface relaxation of strained layers on atomic resolution ADF imaging;Ultramicroscopy;2017-10

2. Direct investigation of (sub-) surface preparation artifacts in GaAs based materials by FIB sectioning;Ultramicroscopy;2016-04

3. Scanning probe microscopy of cleavages of undoped GaInP/AlGaInP and CdS/ZnSSe heterostructures;Bulletin of the Lebedev Physics Institute;2011-02

4. Spectroscopic characterization of carbon chains in nanostructured tetrahedral carbon films synthesized by femtosecond pulsed laser deposition;The Journal of Chemical Physics;2007-04-21

5. Strain distributions in nano-onions with uniform and non-uniform compositions;Nanotechnology;2006-06-15

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