Spectroscopic process sensors in MOVPE device production-Reference-Cited by-同舟云学术

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Spectroscopic process sensors in MOVPE device production

Published:1999-03-01 Issue:3 Volume:68 Page:309-313
ISSN:0947-8396
Container-title:Applied Physics A: Materials Science & Processing
language:
Short-container-title:Applied Physics A: Materials Science & Processing

Author:

Haberland K.,Kurpas P.,Pristovsek M.,Zettler J.-T.,Weyers M.,Richter W.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1007/s003390050893.pdf

Cited by 34 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. In Situ Monitoring of the Al(110)‐[EMImCl] : AlCl₃ Interface by Reflection Anisotropy Spectroscopy;Batteries & Supercaps;2023-11-14

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4. Experimental and Computational Aspects of Electrochemical Reflection Anisotropy Spectroscopy: A Review;ChemElectroChem;2023-03-22

5. Homoepitaxial growth rate measurement and surface morphology monitoring of MOVPE-grown Si-doped (1 0 0) β-Ga2O3 thin films using in-situ reflectance spectroscopy;Journal of Crystal Growth;2023-02

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