Influence of the surface treatment with low-energy $$\hbox {Ar}^{+}$$ Ar + plasma on graphene and defected graphene layers-Reference-Cited by-同舟云学术

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Influence of the surface treatment with low-energy $$\hbox {Ar}^{+}$$ Ar + plasma on graphene and defected graphene layers

Published:2014-10-17 Issue:4 Volume:47 Page:901-912
ISSN:0306-8919
Container-title:Optical and Quantum Electronics
language:en
Short-container-title:Opt Quant Electron

Author:

Milenov Teodor,Avramova Ivalina,Valcheva Evgenia,Tinchev Savcho

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/s11082-014-0037-6.pdf

Reference33 articles.

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2. Becerril, H.A., Mao, J., Liu, Z., Stoltenberg, R.M., Bao, Z., Chen, Y.: Evaluation of solution-processed reduced graphene oxide films as transparent conductors. ACS Nano 2, 463–470 (2008)

3. Berger, C., Song, Z., Li, T., Li, X., Ogbazghi, A.Y., Feng, R., Dai, Z., Marchenko, A.N., Conrad, E.H., First, P.N.: Ultrathin epitaxial graphite: 2D electron gas properties and a route toward graphene-based nanoelectronics. J. Phys. Chem. 108, 19912–19916 (2004)

4. Bradshaw, A.M., Cederbaum, S.L., Domcke, W., Krause, U.: Plasmon coupling to core hole excitations in carbon. J. Phys. C Solid State 7, 4503–4512 (1974)

5. Cançado, L.G., Jorio, A., Ferreira, E.H.M., Stavale, F., Achete, C.A., Capaz, R.B., Moutinho, M.V.O., Lombardo, A., Kulmala, T.S., Ferrari, A.C.: Quantifying defects in graphene via Raman spectroscopy at different excitation energies. Nano Lett. 11, 3190–3196 (2011)

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1. X-ray photoelectron spectroscopy characterization of amorphous and nanosized thin carbon films;20th International Conference and School on Quantum Electronics: Laser Physics and Applications;2019-01-29

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