Quantifying Defects in Graphene via Raman Spectroscopy at Different Excitation Energies-Reference-Cited by-同舟云学术

Quantifying Defects in Graphene via Raman Spectroscopy at Different Excitation Energies

Author:

Cançado L. G.¹,Jorio A.¹,Ferreira E. H. Martins²,Stavale F.²,Achete C. A.²,Capaz R. B.³,Moutinho M. V. O.³,Lombardo A.⁴,Kulmala T. S.⁴,Ferrari A. C.⁴

Affiliation:

1. Departamento de Física, Universidade Federal de Minas Gerais, 30123-970, Belo Horizonte, Brazil

2. Divisão de Metrologia de Materiais, Instituto Nacional de Metrologia, Normalização e Qualidade Industrial (INMETRO), 25250-020, Brazil

3. Instituto de Física, Universidade Federal do Rio de Janeiro, 21941-972, Brazil

4. Department of Engineering, University of Cambridge, Cambridge CB3 0FA, United Kingdom

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

Reference64 articles.

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