Block lift-out sample preparation for 3D experiments in a dual beam focused ion beam microscope
Author:
Publisher
Springer Science and Business Media LLC
Subject
Analytical Chemistry
Link
http://link.springer.com/content/pdf/10.1007/s00604-007-0853-5.pdf
Reference20 articles.
1. High Resolution Focused Ion Beams: FIB and its Applications
2. Introduction to Focused Ion Beams
3. A review of focused ion beam milling techniques for TEM specimen preparation
4. Microfabrication techniques using focused ion beams and emergent applications
5. Applications of focused ion beam microscopy to materials science specimens
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