A Dual-input Fault Diagnosis Model Based on SE-MSCNN for Analog Circuits
Author:
Funder
National Natural Science Foundation of China
Publisher
Springer Science and Business Media LLC
Subject
Artificial Intelligence
Link
https://link.springer.com/content/pdf/10.1007/s10489-022-03665-3.pdf
Reference36 articles.
1. Gao T, Yang J, Jiang S, Yang C (2019) A novel fault diagnostic method for analog circuits using frequency response features. Rev Sci Instrum 90(10):104728
2. Binu D, Kariyappa B (2019) Ridenn: a new rider optimization algorithm-based neural network for fault diagnosis in analog circuits. IEEE Trans Instrum Meas 68(1):2–26
3. Tadeusiewicz M, Halgas S (2018) A method for local parametric fault diagnosis of a broad class of analog integrated circuits. IEEE Trans Instrum Meas 67(2):328–337
4. Xiao Y, Feng L (2012) A novel linear ridgelet network approach for analog fault diagnosis using wavelet-based fractal analysis and kernel pca as preprocessors. Measurement 45(3):297–310
5. Yang C, Zhen L, Hu C (2019) Fault diagnosis of analog filter circuit based on genetic algorithm. IEEE Access 7:54969– 54980
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