Abstract
AbstractIn complex manufacturing systems, such as a semiconductor wafer fabrication facility (wafer fab), it is important to accurately predict cycle times and work-in-progress (WIP) levels. These key performance indicators are commonly predicted using detailed simulation models; however, the detailed simulation models are computationally expensive and have high development and maintenance costs. In this paper, we propose an aggregate modeling approach, where each work area, i.e., a group of functionally similar workstations, in the wafer fab is aggregated into a single-server queueing system. The parameters of the queueing system can be derived directly from arrival and departure data of that work area. To obtain fab-level predictions, our proposed methodology builds a network of aggregate models, where the network represents the entire fab consisting of different work areas. The viability of this method in practice is demonstrated by applying it to a real-world wafer fab. Experiments show that the proposed model can make accurate predictions, but also provide insights into the limitations of aggregate modeling.
Publisher
Springer Science and Business Media LLC
Subject
Industrial and Manufacturing Engineering,Management Science and Operations Research
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献