A novel approach for fault detection of analog circuit by using improved EEMD
Author:
Publisher
Springer Science and Business Media LLC
Subject
Surfaces, Coatings and Films,Hardware and Architecture,Signal Processing
Link
http://link.springer.com/article/10.1007/s10470-018-1362-7/fulltext.html
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3. Venkatsubramanian, V. (2003). A review of process fault detection and diagnosis, Part II: Qualitative models and search strategics. Computers & Chemical Engineering, 27(3), 313–326.
4. Venkatasubramanian, V., Rengaswamy, R., Kavuri, S. N., & Yin, K. (2003). A review of process fault detection and diagnosis: Part III: Process history based methods. Computers & Chemical Engineering, 27(3), 327–346.
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